|Op. System:||Windows XP/Vista/7|
|File size:||4.44 MB|
|Publisher:||János L Lábár|
Publisher description for ProcessDiffraction
ProcessDiffraction is used to quantify measured electron diffraction data for all 3 SAED pattern types:single crystal patterns, Amorphous patterns (Restricted Edition) and Nano-crystalline patterns. This program converts a selected area electron diffraction (SAED) ring pattern (measured from a thin sample in a TEM) into an intensity distribution that is similar to the usual X-ray power diffraction (XRD) data. In order to obtain this distribution, the intensity in the measured SEAD pattern is averaged over circles (or ellipses depending on the experimental distortion) and this averaged intensity is presented graphically as a function of the radius of the circle (that is proportional to the sin value in XRD).